Hot Keywords:

The integration of new elements and the problem of generality level in electrical engineering teaching
Considers how to select and modify the level of generality in the syllabuses of courses in electrical engineering. This is done with respect to the methodology of teaching in general, and teaching measurement in particular: i.e., whether to start from general ideas and go toward details (top-down approach) or to start from details and go toward gen....
Authors:Barwicz;A.Publisher:Frontiers in Education Conference;1988.;ProceedingsConference Date:22-25 Oct. 1988ISSN:Total Page:xx+500
Electronic measuring structure for ultrasonic analysis of solutions
An electronic measuring structure (EMS) for ultrasonic analysis of solutions that acquires measurement information by means of an ultrasonic resonator, estimates the concentration of solution components, and represents the results of the measurements is presented. A brief description of the hardware and software and the requirements on which they a....
Authors:Barwicz;A.Publisher:Instrumentation and Measurement Technology Conference;1989. IMTC-89. Conference Record.;6th IEEEConference Date:25-27 April 1989ISSN:Total Page:xxiv+566
System approach to electrical measurements
A system approach is outlined and applied to electrical measurements. The essential idea of the system approach to electrical measurements is uniform treatment of measurement problems and/or instruments, which can be considered as special cases of a system whose functions are performed via signal processing. The notions of measuring system, its cal....
Authors:Barwicz;A.Publisher:Instrumentation and Measurement Technology Conference;1993. IMTC/93. Conference Record.;IEEEConference Date:18-20 May 1993ISSN:0-7803-1229-5Total Page:xxvi + 793
Towards intelligent spectrometric sensor using standard integration technologies
The problem of improving the quality of measurements, using the integration technologies for implementation of various measurement functions, is addressed. The intelligent spectrometric probe for in situ measurements is under development. The idea of the integrated implementation of the spectrometric sensor based on the standard integration technol....
Authors:Barwicz;A.Publisher:Instrumentation and Measurement Technology Conference;1997. IMTC/97. Proceedings. Sensing;Processing;Networking.;IEEEConference Date:19-21 May 1997ISSN:0-7803-3747-6Total Page:2 vol. xxxiv+1512
Guest editorial - Special issue on measurement microsystems
Authors:Barwicz;A.Publisher:Instrumentation & Measurement Magazine;IEEEConference Date:ISSN:1094-6969Total Page:
Functional and technological integration of measurement microsystems
The field of measurement microsystems has progressed with advances in the fields of microelectronics, micromechanics, microoptics, and digital signal processing (DSP). In this article, the author summarizes a unified conceptual basis for measurement microsystems, discusses some specifics of integration, and describes an innovative approach to the d....
Authors:Barwicz;A.Publisher:Instrumentation & Measurement Magazine;IEEEConference Date:ISSN:1094-6969Total Page:
3D Analysis of scattering losses due to sidewall roughness in microphotonic waveguides: high index-contrast
We present a 3D analysis of scattering losses due to sidewall roughness in rectangular dielectric waveguides valid for any refractive-index-contrast and field polarization. We show that the typical 2D analyses can substantially over-estimate scattering losses.
Authors:Barwicz;T.Publisher:Lasers and Electro-Optics;2005. (CLEO). Conference onConference Date:ISSN:1-55752-795-4Total Page:
An electronic high-pressure measuring system using a polarimetric fiber-optic sensor
An electronic, microcontroller-based system for high-pressure measurement, using a novel fiber-optic sensor, is presented. Attention is given to the problem of how to deal with a nonmonotonic (sinelike) characteristic of the sensor as a function of input pressure. The concept of a multisensor system is discussed, and a three-sensor, microcontroller....
Authors:Barwicz;A.;Bock;W.J.Publisher:Instrumentation and Measurement Technology Conference;1990. IMTC-90. Conference Record.;7th IEEEConference Date:13-15 Feb. 1990ISSN:Total Page:xix+396
Requirements for tools of computer-aided design of measuring systems
The distinctive features of an electronic measuring system as an object of design are pointed out. The essential requirements for an expert system for computer-aided design (CAD) of measuring systems are formulated. Their analysis reveals a growing demand for algorithmization and formalization of the engineering knowledge in the field of metrology ....
Authors:Barwicz;A.;Morawski;R.Z.Publisher:Instrumentation and Measurement Technology Conference;1989. IMTC-89. Conference Record.;6th IEEEConference Date:25-27 April 1989ISSN:Total Page:xxiv+566
An electric high-pressure measuring system using a polarimetric fiber-optic sensor
An electronic microcontroller-based system for high-pressure measurement using a fiber-optic sensor is presented. One of the most distinctive problems in such a system is how to deal with a nonmonotonic (sine-like) input-output characteristic of the sensor. The idea of a multisensor system is discussed, and a three-sensor microcontroller-based on-a....
Authors:Barwicz;A.;Bock;W.J.Publisher:Instrumentation and Measurement;IEEE Transactions onConference Date:ISSN:0018-9456Total Page:
合计88个 | 页次:1/9页 1 [2] [3] [4] [5] [6] [7] [8] [9] 下一页